The TEVAL SIG is pleased to announce our second 2025 issue of Shiken: A Journal of Language Testing and Evaluation in Japan. Thank you to the researchers who submitted their articles to make this issue of the publication possible!
You can access this publication from the publication page of the TEVAL website linked below:
Or, you can access the articles individually from their article links below:
- A validation study of a test of vocabulary depth using many-facet Rasch analysis
Authors: Chihiro Komiya, James Sick, and Stuart McLean - Validating TOEIC Bridge as a placement test
Authors: Trevor Holster and Masaki Akase
If you are looking for a publication opportunity, Shiken: A Journal of Language Testing and Evaluation in Japan is seeking submissions for the projected April 2026 issue. You can learn more about publication details in the Call For Papers.
Please feel free to reach out if you have any questions, comments, or concerns to teval@jalt.org.
