Shiken: JALT Testing & Evaluation SIG Newsletter

Editorial Board

Editors and reviewers are approved annually at the SIG Annual General Meeting
held during the JALT Annual Conference.

Chief Editor

Tim Newfields
(Toyo University Faculty of Economics)

Statistics Column Editor

J.D. Brown
(University of Hawaii at Manoa)

Rasch Column Editor

James Sick
(J. F. Oberlin University, Tokyo)

Research Participants Wanted Column

JIA Yujie
(Hong Kong Polytechnic University)

Reviewers

Jeff Hubbell
(Hosei University)

Cecilia Ikeguchi
(Tsukuba Gakuin University)

H.P.L. Molloy
(Toyo University Faculty of Business Administration)

Ed Schaeffer
(Ochanomizu University)

Chris Weaver
(Toyo University Faculty of Business Administration)

Newsletter: Topic Index

Author Index

Title Index

Date Index
TEVAL SIG: Main Page

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