Shiken: JALT Testing & Evaluation SIG Newsletter

Editorial Board

Editors and reviewers are approved annually at the SIG Annual General Meeting
held during the JALT Annual Conference.

Chief Editor

Tim Newfields
(Toyo University Faculty of Economics)
newfields55 at yahoo dot com

Statistics Column Editor

J.D. Brown
(University of Hawaii at Manoa)

Rasch Column Editor

James Sick
(J. F. Oberlin University, Tokyo)

Reviewers

Mark Chapman
(University of Michigan, English Language Institute)

Jeff Hubbell
(Hosei University)

Ian Mumby
(Hokkai Gakuen University)

H.P.L. Molloy
(Toyo University Faculty of Business Administration)

Joesph Ring
(Toyo University Faculty of Economics)

Ed Schaeffer
(Ochanomizu University)

Chris Weaver
(Toyo University Faculty of Business Administration)

Newsletter: Topic Index

Author Index

Title Index

Date Index
TEVAL SIG: Main Page

Background

Links

Network