Testing and Evaluation SIG


Published: Sat, 12/06/2008 - 3:02pm

The Testing and Evaluation SIG aims to provide avenues for research, information, and discussion related to foreign language testing and evaluation both from within JALT membership and with other professional organizations which have common interests and goals. Please visit our website at www.jalt.org/test.

SIG Officers


James Sick
Edward Schaefer
J. W. Lake
Trevor Holster
Jeffrey Durand

Joining or renewing membership

You can easily join JALT or renew your JALT membership online.

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JALT membership offers numerous benefits including: Member-rate admission to JALT conferences such as the annual JALT international conference; free or member-rate admission to JALT Chapter and SIG meetings and events; access to the latest JALT Publications, and more »

Upcoming Events


Keynote speaker: Dr. John Norris (ETS)
Symposium Panelists Claudia Kunschak (Ritsumeikan University) and Moonyoung Park (Chinese University of Hong Kong)
Saturday, 9 September 2017 - 2:30pm - Sunday, 10 September 2017 - 4:40pm

JALT's TEVAL (Testing and Evaluation) SIG is a cosponsor of the 21st Japan Language Testing Association Annual Conference. The call for papers deadline is June 11, 2017.

Conference dates:

  • Saturday, September 9: Workshop
  • Sunday, September 10, 2017: Keynote speech, symposium, paper and practice presentations

For details, please see the JLTA 2017 website (scroll down for English).

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